Ettus Research Events

to Nov

DARPA Bay Area SDR Hackfest

The physical and cyber worlds are becoming inseparable. Computers, home appliances, vehicles, cameras, and the myriad handheld devices upon which we all now depend are wirelessly connected to each other and to ourselves, with each system striving to achieve its respective mission in an ever more congested electromagnetic (EM) space. This Hackfest is designed to explore and better understand the complex relationships we are creating within the EM spectrum, and examine in particular the cyber-physical intersection of software defined radio (SDR) and remotely piloted aircraft.

to Nov

Annual AOC International Conference

The 54th Annual AOC International Symposium and Convention is the leading trade event of the global Electronic Warfare and Signals Intelligence market. Across the globe, governments spend more than $7 billion per year on EW and SIGINT equipment and services.

Ettus Research will be exhibiting it's latest USRP products. 

to Dec

IEEE Globecom 2017

IEEE GLOBECOM is one of two flagship conferences of the IEEE Communications Society (ComSoc), together with IEEE ICC. Each year the conference attracts about 3000 submitted scientific papers and dozens of proposals for industry events. A technical program committee of more than 1,500 experts provides more than 10,000 reviews, and from this a small fraction of the submitted papers are accepted for publication and presentation at the conference. The conference meets once a year in North America and attracts roughly 2000 leading scientists, researchers and industry practitioners from all around the world. IEEE GLOBECOM is therefore one of the most significant scientific events of the networking and communications community, a must-attend event for scientists, researchers and networking practitioners from industry and academia.

to May


NIWeek 2018 brings together thousands of engineers, scientists, and industry professionals to learn about the latest NI software-centric platform for accelerating development and increasing productivity in test, measurement, and control systems.